LabVIEW Integration Toolkit


Semiconductor Online Newsletter
Volume 3 Issue 8
Monday, December 13, 1999

******** EDITOR'S CHOICE PRODUCTS ********

imgThe Summit Series LabVIEW Integration Toolkit is offered jointly from National Instruments, Cascade Microtech, and Microsys Technologies. With it, semiconductor test engineers can completely integrate and automate their wafer test process.

The toolkit empowers the semiconductor test engineer to take advantage of the many benefits of LabVIEW for prober testing. By using the toolkit, which includes a comprehensive driver, customers can incorporate LabVIEW into Cascade’s Summit Series semiautomatic probers. This makes possible the complete automation of the wafer test.

Benefits of the toolkit include:

  • Effortless integration of measurement software with prober station control
  • Complete automation of wafer test procedures
  • Rapid, easy to use test development
  • Fully customizable solutions

The Summit Series LabVIEW Integration Toolkit is compatible with Windows 95 and LabVIEW 5.x. It works with both the GPIB and Dynamic Data Exchange (DDE) servers of the Cascade PCS. The toolkit comes with an instrument drive, several example programs, an automated installation utility, online help and an operating manual.

Cascade Microtech, 2430 NW 206th Ave., Beaverton, OR 97006. Tel: 800-550-3279. Fax: 503-601-1000.


  Printer friendly version

For further information contact:

Marketing Manager
Microsys Technologies Inc
3710 Nashua Dr, Mississauga, ON, L4V 1M5 Canada

tel:  +1 (905) 678-3288
fax: +1 (905) 678-3319
email: marketing@micro-sys.com


Head Office: 3710 Nashua Drive, Mississauga ON L4V 1M5, Canada
Telephone: +1 (905) 678-3288 | Fax: +1 (905) 678-3319

© Microsys Technologies Inc. All rights reserved.